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  • Analysis and Expansion of a Compact Model of Propagation Delay Time for Nano-CMOS NAND Gates in Response to Statistical Variability of Fabrication

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Manuscript ID : 139611211430860734 Visit : 5968 Page: 285 - 292

20.1001.1.16823745.1396.15.4.6.1

Article Type: Original Research

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